https://doi.org/10.1140/epjs/s11734-026-02355-2
Regular Article
High-resolution charge-exchange spectroscopy of Si
ions with an X-ray microcalorimeter
1
Max-Planck-Institut für Kernphysik, Saupfercheckweg 1, 69117, Heidelberg, Germany
2
Heidelberg Graduate School for Physics, Ruprecht-Karls-Universität Heidelberg, Im Neuenheimer Feld 226, 69120, Heidelberg, Germany
3
NASA Goddard Space Flight Center, 8800 Greenbelt Rd, 20771, Greenbelt, MD, USA
4
Department of Physics and Astronomy, Johns Hopkins University, 3400 N. Charles Street, 21218, Baltimore, MD, USA
5
IRAP, Université de Toulouse, CNRS, 9 Av. du Colonel Roche, 31400, Toulouse, France
6
SRON, Space Research Organisation Netherlands, Niels Bohrweg 4, 2333, Leiden, The Netherlands
a
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Received:
28
February
2026
Accepted:
24
April
2026
Published online:
8
May
2026
Abstract
Charge exchange between highly charged ions and neutral atoms at collision energies in the keV range occurs in many astrophysical environments. Modeling this quasi-molecular process is difficult, and accurate laboratory data are scarce. We report charge-exchange measurements of highly charged silicon ions using a superconducting transition-edge X-ray microcalorimeter with an energy resolution of approximately 2 eV FWHM at the Si K
energy and an electron beam ion trap. By using its magnetic trapping mode, i. e, cyclically turning the electron beam on and off, we isolate charge-exchange–induced emission and distinguish radiative cascade features unresolved with semiconductor detectors. These measurements can help isolating their contributions to the X-ray spectra of hot astrophysical plasmas from the dominant thermal excitation mechanisms, in particular for Rydberg states of the highly charged ions. Additionally, we present high resolution spectra of the Si Li-like K
- to K
-transitions observed during the beam-on phase.
© The Author(s) 2026
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