https://doi.org/10.1140/epjst/e2008-00415-7
Thermal characterization of micro-structured NiTi samples by 3ω scanning thermal microscopy
1
Institut fuer Experimentalphysik, Ruhr-Universitaet, 44801 Bochum, Germany
2
LTP, UTAP, Université de Reims, BP. 1039, 51687 Reims Cedex 2, France
The lateral modification of the thermal conductivity of a NiTi sample have been measured by scanning thermal microscope using the 3ω-technique. Squares of lateral length in the micrometer range had been drawn in a polycrystalline NiTi sample by a focussed ion beam of Ga. Amplitude and phase of the 3ω-signal have been recorded at some selected positions as a function of frequency between 10 Hz and 10 KHz and as a function of position at selected modulation frequencies. The 3ω-signals are modified inside the squares as well as the border lines and also change when the temperature is increased above the martensite-austenite transition temperature.
© EDP Sciences, Springer-Verlag, 2008
