https://doi.org/10.1140/epjst/e2008-00804-x
Editorial
1
Max-Planck-Institut für Quantenoptik, 85748 Garching, Germany
2
D.I. Mendeleev Institute for Metrology (VNIIM), St. Petersburg, 190005, Russia
3
Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany
This article has no abstract.
© EDP Sciences, Springer-Verlag, 2008