https://doi.org/10.1140/epjst/e2009-00973-0
Probing free xenon clusters from within
1
Physics Department, Western Michigan University, Kalamazoo, MI, 49008, USA
2
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
3
Linac Coherent Light Source, Stanford Linear Accelerator Center, Menlo Park, California, 94025, USA
4
Department of Physics, University
of Turku, 20014 Turku, Finland
5
Centro de Física de Materiales, Centro Mixto CSIC-UPV/EHU and DIPC, 20018 San Sebastian, Spain
6
Instituto de Optica, CSIC, 28006 Madrid, Spain
Corresponding author: nora.berrah@wmich.edu
Inner-shell and valence-shell photoionization of van-der-Waals Xe clusters have been measured using both angle-resolved photoelectron spectroscopy and velocity map ion imaging technique. Both techniques have been used to probe the electronic properties and the fragmentation dynamics of clusters as a function of photon energy and cluster size. In particular, the evolution of the photoelectron angular distributions and partial cross sections as a function of photon energy and cluster size has revealed cluster size effects similar to the ones found in solids. Our cluster angular distribution parameters have been compared to the free atoms. In addition, the measurement of the fragmentation dynamic of the clusters seems to be photon energy dependent.
© EDP Sciences, Springer-Verlag, 2009
