Eur. Phys. J. Special Topics 186, 123-165 (2010)
https://doi.org/10.1140/epjst/e2010-01262-7

Review

Marked point processes for statistical and morphological analysis of astronomical data

Université Lille 1, Laboratoire Paul Painlevé, 59655 Villeneuve d’Ascq Cedex, France

^a e-mail: radu.stoica@math.univ-lille1.fr

Received: 12 July 2010
Revised: 3 August 2010
Published online: 14 September 2010

Abstract

This chapter presents fundamental notions concerning stochastic modelling, simulation and statistical inference based on marked point processes. The application aimed by this presentation is pattern detection in spatial astronomical data.