Marked point processes for statistical and morphological analysis of astronomical data
Université Lille 1, Laboratoire Paul Painlevé, 59655 Villeneuve d’Ascq Cedex, France
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Revised: 3 August 2010
Published online: 14 September 2010
This chapter presents fundamental notions concerning stochastic modelling, simulation and statistical inference based on marked point processes. The application aimed by this presentation is pattern detection in spatial astronomical data.
© EDP Sciences, Springer-Verlag, 2010