Eur. Phys. J. Special Topics 189, 165-171 (2010)
https://doi.org/10.1140/epjst/e2010-01319-7

Regular Article

Glass transition and dynamics of single and stacked thin films of poly(2-chlorostyrene)

¹ Department of Physics, Ritsumeikan University, Noji-Higashi 1-1-1, Kusatsu 525-8577, Japan
² Research Organization of Science and Engineering, Ritsumeikan University, Kusatsu 525-8577, Japan

^a e-mail: fukao.koji@gmail.com

Received: 1 September 2010
Revised: 14 September 2010
Published online: 12 November 2010

Abstract

The glass transition temperature and the dynamics of the α-process have been investigated using dielectric relaxation spectroscopy for single and stacked thin films of poly(2-chlorostyrene) (P2CS). The stacked film consists of 10 layers of single thin films with thickness of 12 nm or 18 nm. The glass transition temperature T_g of the single thin films of P2CS is found to decrease with decreasing film thickness in a similar way as observed for polystyrene thin films. The magnitude of the depression of T_g for the stacked thin films is larger than that of the single thin films with corresponding thickness. The depression of the temperature at which the dielectric loss shows a peak due to the α-process at a given frequency, T_α, is larger than that of the single thin films, although the magnitude is smaller than that of T_g. Annealing at a high temperature could cause the T_g and T_α of the stacked thin films to approach the values of the bulk system.