Eur. Phys. J. Special Topics 208, 177-187 (2012)
https://doi.org/10.1140/epjst/e2012-01618-y

Regular Article

Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity

¹ Institut Néel, CNRS et Université Joseph Fourier, BP. 166, 38042 Grenoble Cedex 9, France
² Laboratorio di Chimica per le Tecnologie, Universita di Brescia, 25123 Brescia, Italy
³ Synchrotron SOLEIL, L’Orme des Merisiers, Saint-Aubin, Boîte Postale 48, 91192 Gif-sur-Yvette Cedex, France
⁴ Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany

^a e-mail: jean-marc.tonnerre@grenoble.cnrs.fr

Received: 21 December 2011
Revised: 23 March 2012
Published online: 15 June 2012

Abstract

The analysis of complex magnetic profiles throughout an ultrathin magnetic films by soft X-ray resonant magnetic reflectivity is discussed. Subnanometer resolution can be achieved allowing the separation of interface and inner layer magnetic contributions as well as the determination of antiferromagnetic and non-collinear spin structures. Reflectivity measurements are carried out up to large scattering angles allowing the determination of the depth-resolved profiles of the out-of-plane magnetic component.