https://doi.org/10.1140/epjst/e2012-01623-2
Review
Quantitative anomalous small-angle X-ray scattering – The determination of chemical concentrations in nano-scaled phases
1 Institute of Soft Matter and Functional Materials, Helmholtz-Zentrum Berlin, Germany
2 Universität Paderborn, Fakultät für Naturwissenschaften, Department Chemie, Germany
3 Leibniz-Institute IFW Dresden, Institute for Complex Materials, Germany
4 Colorado School of Mines, USA
a e-mail: guenter.goerigk@helmholtz-berlin.de
Received:
15
October
2011
Revised:
23
March
2012
Published online:
15
June
2012
In the last years Anomalous Small-Angle X-ray Scattering became a precise quantitative method resolving scattering contributions two or three orders of magnitude smaller compared to the overall small-angle scattering, which are related to the so-called pure-resonant scattering contribution. Additionally to the structural information precise quantitative information about the different constituents of multi-component systems like the fraction of a chemical component implemented into the materials nanostructures are obtained from these scattering contributions. The application of the Gauss elimination algorithm to the vector equation established by ASAXS measurements at three X-ray energies is demonstrated for three examples from chemistry and solid state physics. All examples deal with the quantitative analysis of the Resonant Invariant (RI-analysis). From the integrals of the pure-resonant scattering contribution the chemical concentrations in nano-scaled phases are determined. In one example the correlated analysis of the Resonant Invariant and the Non-resonant Invariant (NI-analysis) is employed.
© EDP Sciences, Springer-Verlag, 2012
