https://doi.org/10.1140/epjs/s11734-021-00071-7
Regular Article
Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit
1
Dipartimento di Fisica e Astronomia “Ettore Majorana”, Università di Catania, Via S. Sofia 64, 95123, Catania, Italy
2
INFN, Sez. Catania, 95123, Catania, Italy
3
CNR-IMM, Via S. Sofia 64, I-95123, Catania, Italy
c
elisabetta.paladino@dfa.unict.it
Received:
27
April
2020
Accepted:
5
January
2021
Published online:
16
April
2021
We investigate critical current noise in short ballistic graphene Josephson junctions in the open-circuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence 
, strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.
© The Author(s) 2021
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