Eur. Phys. J. Special Topics 208, 291-304 (2012)
https://doi.org/10.1140/epjst/e2012-01625-0

Review

Anomalous X-ray scattering studies on semiconducting and metallic glasses

¹ Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities, Hiroshima Institute of Technology, Hiroshima 731-5193, Japan
² Fachbereich Chemie, Physikalische Chemie, Philipps-Universität Marburg, 35032 Marburg, Germany
³ Institut Néel, Centre National de la Recherche Scientifique/Université Joseph Fourier (CNRS/UJF), 38042 Grenoble Cedex 9, France
⁴ Research and Utilization Division, SPring-8/JASRI, Hyogo 679-5198, Japan

^a Present address: Department of Physics, Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan, e-mail: hosokawa@sci.kumamoto-u.ac.jp

Received: 13 October 2011
Revised: 23 March 2012
Published online: 15 June 2012

Abstract

In order to explore local- and intermediate-range atomic structures of several semiconducting and metallic glasses, anomalous X-ray scattering (AXS) experiments were performed using an improved detecting system suitable for third-generation synchrotron radiation facilities, and the obtained data were analyzed using reverse Monte Carlo (RMC) modelling to obtain partial structure factors and to construct three-dimensional atomic configurations of these glasses. Examples of GeSe₂ semiconducting and Pd₄₀Ni₄₀P₂₀ metallic glasses are demonstrated to exhibit the feasibility of the combination of AXS and RMC techniques. Importance of an additional combination with neutron scattering is also described for alloys containing light elements.