https://doi.org/10.1140/epjst/e2012-01626-y
Review
Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges
Dept. of Physics, NCSU, Raleigh, NC 27596, USA
a e-mail: harald_ade@ncsu.edu
Received:
15
February
2012
Revised:
23
March
2012
Published online:
15
June
2012
The use of soft X-rays near the carbon absorption edge (∼270–300 eV) for small angle X-ray scattering and X-ray reflectivity experiments has significantly expanded the scientific capabilities to investigate thin films of soft matter that are primarily composed of carbon and low Z heteroatoms. In this perspective, we will delineate the basic operating principles and underlying physics of these methods and exemplify their impact by discussing a few recent applications. An extension of these methods to the fluorine edge is also included, demonstrating that the general concepts are also applicable to absorption edges of hetero atoms in soft matter. A short perspective of some future developments is provided.
© EDP Sciences, Springer-Verlag, 2012
