2024 Impact factor 2.3
Special Topics

EPJ D Topical Review: Self-assembling and self-limiting monolayer deposition

The effect of spatial ordering of molecules on surfaces is commonly utilised to deposit ultra-thin films, where the film thickness is only a few nanometres. In this EPJ D review paper, several methods are discussed that are distinguished from other thin film deposition processes by exactly these effects, leading to self-assembling and self-limiting layer growth and, eventually, to coatings with unique and fascinating properties, and applications in micro-electronics, optics, chemistry, and biology.

Traditional methods for the formation of self-assembled films, including the Langmuir-Blodgett technique for ordered organic molecules and thermal atomic layer deposition (ALD) for inorganic molecules, are evaluated. This overview is complemented by a discussion of more recent developments for the deposition of organic or hybrid films by molecular layer deposition. Particular attention is given to plasma-assisted techniques, whether employed as a preparative step, a supplementary step, or as an inherent part of the deposition, as in plasma enhanced ALD (PE-ALD) or plasma-assisted repeated grafting deposition (PA-RGD). The different methods are compared and their film formation mechanisms, together with their advantages, are presented from the perspective of a plasma scientist. The paper contains lists of established film compounds, and a collection of relevant literature is provided for further reading.

Self-assembling and self-limiting monolayer deposition. Rüdiger Foest, Martin Schmidt and Hassan Gargouri (2014) Eur.Phys. J. D, DOI: 10.1140/epjd/e2013-40420-y

Managing Editors
Sandrine Karpe and Vijala Kiruvanayagam (EDP Sciences) and Sabine Lehr (Springer-Verlag)
Thank you very much, Isabelle! Very timely. And the cover looks fantastic! We are grateful for the great collaboration! Best wishes.

Dirk Helbing, ETH Zurich, Switzerland
Editor EPJ Special Topics 214, 2012

ISSN: 1951-6355 (Print Edition)
ISSN: 1951-6401 (Electronic Edition)

© EDP Sciences and Springer-Verlag