2024 Impact factor 2.3
Special Topics

EPJ Web of Conferences Highlight – EOSAM 2024: EOS Annual Meeting

EOSAM 2024, Naples, Italy.

A Vibrant Gathering of Minds in Naples

The European Optical Society Annual Meeting (EOSAM) 2024 was held in Naples, Italy, September 9-13, at the CESTEV facilities of the University of Naples Federico II. This year's event was organized in close collaboration with the Italian Society for Optics and Photonics (SIOF), the Italian branch of the European Optical Society (EOS).

EOSAM 2024 attracted 470 top researchers, key leaders, students, and industry experts from 36 countries worldwide, with half of the countries represented from outside of Europe. The conference agenda was rich and diverse, featuring:

  • 10 Topical Meetings (TOMs): Silicon Photonics; Optical Metrology; Optical Design, Tolerancing and Manufacturing; BioPhotonics; Nanophotonics; Optical Materials; Ultrafast Phenomena; Nonlinear and Quantum Optics; Opto-electronics and Microsystems; and Applications of Optics and Photonics
  • 5 Focused Sessions on trending topics
  • 12 tutorials covering TOM and Focused session topics
  • EU Project Sessions, Early Stage Researcher Session, and Session on Industrial Mastering of Optical Technologies and Systems
  • Exhibition and Industrial Program, including the Industrial Optics Podium Session, strengthening the ties between academia and industry

This gathering not only showcased the latest advancements in optics and photonics but also fostered a vibrant community of professionals and scholars, setting the stage for future collaborations and innovations.

Managing Editors
Sandrine Karpe and Vijala Kiruvanayagam (EDP Sciences) and Sabine Lehr (Springer-Verlag)
Dear Sabine,
On this occasion, may I also thank you for your support: collaboration with you is always very pleasant and effective. Have a nice day, yours, Yurij

Yurij Holovatch, National Academy of Sciences, Lviv, Ukraine
Editor EPJ Special Topics 216, 2013

ISSN: 1951-6355 (Print Edition)
ISSN: 1951-6401 (Electronic Edition)

© EDP Sciences and Springer-Verlag