The European Physical Journal Special Topics

Open Access

Editorial

Editorial p. 1

Michèle Sauvage, Fabrice Cousin and Jean Daillant

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00928-5

• Abstract
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Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction p. 3

M.-I. Richard, N. A. Katcho, M. G. Proietti, H. Renevier, V. Favre-Nicolin, Z. Zhong, G. Chen, M. Stoffel, O. Schmidt, G. Renaud et al. (2 more)

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00929-4

• Abstract
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Real-time studies of thin film growth: Measurement and analysis of X-ray growth oscillations beyond the anti-Bragg point p. 11

S. Kowarik, A. Gerlach, M. Skoda, S. Sellner and F. Schreiber

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00930-y

• Abstract
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Real-time icosahedral to fcc structure transition during CoPt nanoparticles formation p. 19

J. Penuelas, P. Andreazza, C. Andreazza-Vignolle, C. Mottet, M. De Santis and H. C.N. Tolentino

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00931-x

• Abstract
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Effect of surface roughness on multilayer film growth p. 27

M. H. Modi, S. K. Rai, M. Thomasset, G. S. Lodha and M. Idir

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00932-9

• Abstract
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Atomic-scale X-ray structural analysis of self-assembled monolayers on Silicon p. 33

J.-C. Lin, J. A. Kellar, J.-H. Kim, N. L. Yoder, K. H. Bevan, S. T. Nguyen, M. C. Hersam and M. J. Bedzyk

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00933-8

• Abstract
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X-ray diffraction study of the composition and strain fields in buried SiGe islands p. 41

N. Hrauda, J. J. Zhang, M. Stoffel, J. Stangl, G. Bauer, A. Rehman-Khan, V. Holý, O. G. Schmidt, V. Jovanovic and L. K. Nanver

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00934-7

• Abstract
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Modelling x-ray scattering from quantum dots using Keating energy-minimised structures p. 47

J. L. Rawle and P. B. Howes

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00935-6

• Abstract
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Crystalline structure of oxide-based epitaxial tunnel junctions - The effect of optical lithography studied by X-ray microdiffraction p. 53

C. Mocuta, A. Barbier, A. V. Ramos, M.-J. Guittet, J.-B. Moussy, S. Stanescu, C. Gatel, R. Mattana, C. Deranlot and F. Petroff

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00936-5

• Abstract
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Crystal structure determination from two-dimensional powders: A combined experimental and theoretical approach - The example para-cyano-quaterphenylene p. 59

A. Moser, O. Werzer, H.-G. Flesch, M. Koini, D.-M. Smilgies, D. Nabok, P. Puschnig, C. Ambrosch-Draxl, M. Schiek et al. (2 more)

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00937-4

• Abstract
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Structural study on y thin films on perovskite (011) substrate p. 67

Y. Wakabayashi, N. Takubo, K. Miyano and H. Sawa

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00938-3

• Abstract
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Time-of-flight grazing incidence small angle neutron scattering on Gd nanowires p. 73

W. Kreuzpaintner, J.-F. Moulin, D. Lott, R. Kampmann, M. Haese-Seiller, M. Störmer and A. Schreyer

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00939-2

• Abstract
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Three dimensional reconstruction of nanoislands from grazing-incidence small-angle X-ray scattering p. 81

O. M. Yefanov and I. A. Vartanyants

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00940-9

• Abstract
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Resonances and off-specular scattering in neutron waveguides p. 87

S. V. Kozhevnikov, F. Ott, A. Paul and L. Rosta

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00941-8

• Abstract
• PDF (339.3 KB)

New designs for high intensity specular neutron reflectometers p. 93

F. Ott and A. Menelle

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00942-7

• Abstract
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Rapid X-ray reflectivity measurement using a new liquid interface reflectometer at SPring-8 p. 101

Y. F. Yano, T. Uruga, H. Tanida, H. Toyokawa, Y. Terada, M. Takagaki and H. Yamada

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00943-6

• Abstract
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Time of flight grazing incidence small angle neutron scattering - A novel scattering technique for the investigation of nanostructured polymer films p. 107

P. Müller-Buschbaum, E. Metwalli, J.-F. Moulin, V. Kudryashov, M. Haese-Seiller and R. Kampmann

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00944-5

• Abstract
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A simultaneous multiwavelength dispersive X-ray reflectometer for time-resolved reflectometry p. 113

T. Matsushita, E. Arakawa, Y. Niwa, Y. Inada, T. Hatano, T. Harada, Y. Higashi, K. Hirano, K. Sakurai et al. (2 more)

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00945-4

• Abstract
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The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers p. 121

S. Swaraj, C. Wang, T. Araki, G. Mitchell, L. Liu, S. Gaynor, B. Deshmukh, H. Yan, C. R. McNeill and H. Ade

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00946-3

• Abstract
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Adsorption at liquid interfaces: A comparison of multiple experimental techniques p. 127

B. M. Law, M.D. Brown, L. Marchand, L. B. Lurio, W. A. Hamilton, I. Kuzmenko, T. Gog, S. Satija, E. Watkins and J. Majewski

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00947-2

• Abstract
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In situ observation of maghemite nanoparticle adsorption at the water/gas interface p. 133

M. Paulus, P. Degen, S. Schmacke, M. Maas, R. Kahner, B. Struth, M. Tolan and H. Rehage

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00948-1

• Abstract
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Following transient phases at the air/water interface p. 137

M. Meron, J. Gebhardt, H. Brewer, J. P. Viccaro and B. Lin

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00949-0

• Abstract
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Melting of thin films of alkanes on magnesium oxide p. 143

T. Arnold, A. Barbour, S. Chanaa, R. E. Cook, D. Fernandez-Canato, P. Landry, T. Seydel, P. Yaron and J. Z. Larese

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00950-7

• Abstract
• PDF (503.4 KB)

Phase separation of carboxylic acids on graphite surface at submonolayer regime p. 151

M. D. Alba, A. K. Bickerstaffe, M. A. Castro, S. M. Clarke, S. Medina, C. Millán, M. M. Orta, E. Pavón and A. C. Perdigón

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00951-6

• Abstract
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X-ray surface radiolysis: Kinetics of the metal-organic interface formation p. 157

P. Fontaine, M.-C. Fauré, S. Remita, F. Muller and M. Goldmann

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00952-5

• Abstract
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Observation of slowly decreasing molecular oscillations in ultrathin liquid films using X-ray reflectivity p. 163

D. R. Lee, S. H. Choi, H. H. Lee, J.-Y. Kim and C.-J. Yu

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00953-4

• Abstract
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Asphaltene multilayer growth in porous medium probed by SANS p. 171

J. Gummel, Y. Corvis, J. Jestin, J. M'Hamdi and L. Barré

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00954-3

• Abstract
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Probing simultaneously the volume and surface structure of nanospheres adsorbed at a solid-liquid interface by GISANS p. 177

F. Cousin, J. Jestin, G. Chaboussant, S. Gautrot, A. Menelle and F. Ott

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00955-2

• Abstract
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Characterizing the structure of protein layers adsorbed onto functionalized surfaces by means of in-situ X-ray reflectivity p. 185

F. Evers, K. Shokuie, M. Paulus, S. Tiemeyer, Ch. Sternemann, C. Czeslik and M. Tolan

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00956-1

• Abstract
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The structural variety of DNA-DPPC-divalent metal cation aggregates: SAXD and SANS study p. 191

D. Uhríková, P. Pullmannová, N. Kučerka, S. S. Funari, J. Teixeira and P. Balgavý

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00957-0

• Abstract
• PDF (415.5 KB)