Eur. Phys. J. Special Topics 172, 323-332 (2009)
https://doi.org/10.1140/epjst/e2009-01057-y
https://doi.org/10.1140/epjst/e2009-01057-y
Thermometry by micro and nanodevices
1
Centre for Metrology and Accreditation, PO Box 9, 02151 Espoo, Finland
2
Low Temperature Laboratory, Helsinki University of Technology, PO Box 2200, 02015 HUT, Finland
In this paper we briefly discuss the current provisional temperature scale of 2000 (PLTS-2000) for low temperatures. Electronic thermometry is presented and discussed, focusing on its potential in verifying and realizing a future temperature scale. The discussion covers secondary thermometers such as NIS and SIS thermometers and noise, shot noise and Coulomb blockade primary thermometers. The last one is discussed in more detail.
© EDP Sciences, Springer-Verlag, 2009
