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EPJ ST - Special Topics
Special Topics

EPJ Applied Physics presents Review of EELS over the last 50 years by Christian Colliex

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Published on 30 June 2022

‘In this special volume, we are deeply honored to publish an extensive review, by Christian Colliex, of the development of Electron Energy Loss Spectroscopy (EELS) in a Transmission Electron Microscope (TEM)… We warmly thank Dr. Colliex for this contribution that will undoubtably become a major reference for researchers in the electron microscopy and materials science community.’
Damien Jacob, Suzanne Giorgio and Virginie Serin

From early to present and future achievements of EELS in the TEM
By Christian Colliex

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Managing Editors
Sandrine Karpe and Vijala Kiruvanayagam (EDP Sciences) and Sabine Lehr (Springer-Verlag)
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Dear Sabine,
For me it was a great pleasure to work with you, Christian and Isabelle. All questions have been resolved very fast. And amiability and competence of Isabelle are inestimable. Best regards,

Natasha Kirova, CNRS & University Paris Sud, Orsay, France
Editor EPJ Special Topics 222/5, 2013

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ISSN: 1951-6355 (Print Edition)
ISSN: 1951-6401 (Electronic Edition)

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