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Special Topics

EPJ Applied Physics presents Review of EELS over the last 50 years by Christian Colliex

‘In this special volume, we are deeply honored to publish an extensive review, by Christian Colliex, of the development of Electron Energy Loss Spectroscopy (EELS) in a Transmission Electron Microscope (TEM)… We warmly thank Dr. Colliex for this contribution that will undoubtably become a major reference for researchers in the electron microscopy and materials science community.’
Damien Jacob, Suzanne Giorgio and Virginie Serin

From early to present and future achievements of EELS in the TEM
By Christian Colliex

Managing Editors
Anne Ruimy and Vijala Kiruvanayagam (EDP Sciences) and Sabine Lehr (Springer-Verlag)
Dear Sabine and Isabelle,
Thank you so much for all your help and excellent work you did on the EPJ ST volume "Nonlinear Dynamics of Deterministic and Stochastic Systems: Unraveling Complexity". This was a great experience and collaboration.

Alexander Neiman (on behalf of the guest editors), Ohio University, Athens, USA
Editor EPJ Special Topics 222/10, 2013

ISSN: 1951-6355 (Print Edition)
ISSN: 1951-6401 (Electronic Edition)

© EDP Sciences and Springer-Verlag

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