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Special Topics

EPJ Applied Physics presents Review of EELS over the last 50 years by Christian Colliex

‘In this special volume, we are deeply honored to publish an extensive review, by Christian Colliex, of the development of Electron Energy Loss Spectroscopy (EELS) in a Transmission Electron Microscope (TEM)… We warmly thank Dr. Colliex for this contribution that will undoubtably become a major reference for researchers in the electron microscopy and materials science community.’
Damien Jacob, Suzanne Giorgio and Virginie Serin

From early to present and future achievements of EELS in the TEM
By Christian Colliex

Managing Editors
Sandrine Karpe and Vijala Kiruvanayagam (EDP Sciences) and Sabine Lehr (Springer-Verlag)
Dear Sabine, Sandrine, and Nicolas, your professional and efficient management supported our editing tasks enormously and made the whole process smooth and pleasant. The web-based SAGA system was very helpful for handling the workflow. Thank you all for your high commitment!

Jan Freund, ICBM, University of Oldenburg, Germany

ISSN: 1951-6355 (Print Edition)
ISSN: 1951-6401 (Electronic Edition)

© EDP Sciences and Springer-Verlag